SUBSTITUTION OF DEFECTIVE READOUT CIRCUITS IN IMAGERS

摘要

An imaging system configured with readout circuit redundancy is disclosed. Pixel data from a particular column can be steered around a defective readout circuit to an operational readout circuit. Thus, larger imaging arrays which are generally more prone to common column circuitry defects are enabled. In addition, imaging systems configured with significant on-chip signal processing, which are also more prone to common column circuitry defects, are enabled. The occurrence of lost pixel data from an entire column is eliminated or otherwise reduced, thereby increasing overall operability and yield of the imaging system. The system can be implemented on a single chip or a chip set.