发明名称 Segmented attenuator with glitch reduction
摘要 A method and circuit for significantly reducing the switching transients of a digital step attenuator (DSA) by employing a segmented architecture that combines thermometer and binary coded stages. This approach reduces the number of attenuator stages switching at the same time and thus minimizes any glitch amplitude. Embodiments of a segmented DSA may be realized with “pi” and “bridged-T” attenuators, as well as with simple tuned L-pad attenuators combined in a resistor ladder network.
申请公布号 US9397635(B2) 申请公布日期 2016.07.19
申请号 US201314084439 申请日期 2013.11.19
申请人 Peregrine Semiconductor Corporation 发明人 Costa Damian
分类号 H03H11/24 主分类号 H03H11/24
代理机构 Jaquez Land Greenhaus LLP 代理人 Jaquez Land Greenhaus LLP ;Jaquez, Esq. Martin J.;Land, Esq. John
主权项 1. A segmented digital step attenuator circuit, including: (a) at least one first segment comprising a plurality of individual thermometer encoded L-pad type bypassable attenuator circuits; and (b) at least one second segment comprising a plurality of individual binary encoded L-pad type bypassable attenuator circuits coupled in series with the at least one first segment of individual thermometer encoded L-pad type bypassable attenuator circuits; wherein applying a set of individual control signals to the first segments of individual thermometer encoded L-pad type bypassable attenuator circuits and a set of binary encoded control signals to the second segments of individual binary encoded L-pad type bypassable attenuator circuits selects an attenuation level for an input signal applied to the series coupled first and second segments.
地址 San Diego CA US