发明名称 |
Segmented attenuator with glitch reduction |
摘要 |
A method and circuit for significantly reducing the switching transients of a digital step attenuator (DSA) by employing a segmented architecture that combines thermometer and binary coded stages. This approach reduces the number of attenuator stages switching at the same time and thus minimizes any glitch amplitude. Embodiments of a segmented DSA may be realized with “pi” and “bridged-T” attenuators, as well as with simple tuned L-pad attenuators combined in a resistor ladder network. |
申请公布号 |
US9397635(B2) |
申请公布日期 |
2016.07.19 |
申请号 |
US201314084439 |
申请日期 |
2013.11.19 |
申请人 |
Peregrine Semiconductor Corporation |
发明人 |
Costa Damian |
分类号 |
H03H11/24 |
主分类号 |
H03H11/24 |
代理机构 |
Jaquez Land Greenhaus LLP |
代理人 |
Jaquez Land Greenhaus LLP ;Jaquez, Esq. Martin J.;Land, Esq. John |
主权项 |
1. A segmented digital step attenuator circuit, including:
(a) at least one first segment comprising a plurality of individual thermometer encoded L-pad type bypassable attenuator circuits; and (b) at least one second segment comprising a plurality of individual binary encoded L-pad type bypassable attenuator circuits coupled in series with the at least one first segment of individual thermometer encoded L-pad type bypassable attenuator circuits; wherein applying a set of individual control signals to the first segments of individual thermometer encoded L-pad type bypassable attenuator circuits and a set of binary encoded control signals to the second segments of individual binary encoded L-pad type bypassable attenuator circuits selects an attenuation level for an input signal applied to the series coupled first and second segments. |
地址 |
San Diego CA US |