发明名称 INTERCONNECTING STRUCTURE, PROBE CARD AND METHOD FOR MANUFACTURING THE PROBE CARD
摘要 Disclosed is an interconnecting structure. The interconnecting structure includes: a contactor including a tip part which comes in contact with an object to be connected and a first contact part formed to be extended, from the tip part, in an upper side direction; a connection including a second contact part overlapping the first contact part of the contactor in a vertical direction and an upper part formed to be extended, from the second contact part, in the upper side direction; and an elastic body disposed to enclose the first contact part of the contactor and the second contact part of the connection.
申请公布号 KR20160111790(A) 申请公布日期 2016.09.27
申请号 KR20150036944 申请日期 2015.03.17
申请人 M2N INC. 发明人 PARK, YOUNG GEUN;KIM, KWANG HO
分类号 G01R1/067;G01R1/073 主分类号 G01R1/067
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