发明名称 Semiconductor apparatus with variable resistor having tapered double-layered sidewall spacers and method for fabricating the same
摘要 A method for fabricating a semiconductor apparatus includes forming a variable resistor region, and forming a spacer having a top linewidth and a bottom linewidth substantially equal to each other in the variable resistor region. The forming of the spacer includes forming a first insulating layer in the variable resistor region through a first method, forming a second insulating layer along a surface of the first insulating layer in the variable resistor region through a second method for providing step coverage superior to the first method, and etching the first and second insulating layers.
申请公布号 US9502648(B2) 申请公布日期 2016.11.22
申请号 US201414566305 申请日期 2014.12.10
申请人 SK Hynix Inc. 发明人 Yoon Jae Sung
分类号 H01L45/00;H01L27/24;H01L27/22 主分类号 H01L45/00
代理机构 I P & T Group LLP 代理人 I P & T Group LLP
主权项 1. A method for fabricating a semiconductor apparatus, the method comprising: forming a lower electrode on a semiconductor substrate; forming an interlayer insulating layer on the semiconductor substrate; etching the interlayer insulating layer thus exposing an upper surface of the lower electrode, thereby forming a variable resistor region; non-conformally forming a first insulating layer along the interlayer insulating layer and the exposed lower electrode using a PVD (physical vapor deposition) method; conformally forming a second insulating layer over a surface of the first insulating layer using a CVD (chemical vapor deposition) or an ALD (atomic layer deposition); etching the first and the second insulating layers, thereby forming a spacer in the variable resistor region; forming a variable resistor device, which is in contact with the lower electrode, in the variable resistor region in which the spacer is formed; and forming an upper electrode over the variable resistor device to be coupled to the variable resistor device.
地址 Gyeonggi-do KR