发明名称 Semiconductor device
摘要 A semiconductor device includes a transistor, a package in which the transistor is molded, a first heatsink plate, and a second heatsink plate. The first heatsink plate is bonded to a first surface of the package, and is fixed to one surface of the transistor in the package. The second heatsink plate is bonded to a second surface of the package so as to be opposed to the first heatsink plate, and is fixed to the transistor in the package. The second surface is opposite to the first surface. A bonded surface of the first heatsink plate with the plastic body includes a high stress area in which tensile stress equal to or higher than a predetermined stress value is generated. A plurality of grooves are provided in the high stress area.
申请公布号 US9502326(B2) 申请公布日期 2016.11.22
申请号 US201514964920 申请日期 2015.12.10
申请人 Toyota Jidosha Kabushiki Kaisha 发明人 Kadoguchi Takuya
分类号 H01L23/34;H01L23/367;H01L23/373 主分类号 H01L23/34
代理机构 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP 代理人 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
主权项 1. A semiconductor device comprising: a semiconductor element; a plastic body in which the semiconductor element is embedded; a first heatsink plate bonded to a first surface of the plastic body, the first heatsink plate being fixed to the semiconductor element in the plastic body; and a second heatsink plate bonded to a second surface of the plastic body so as to be opposed to the first heatsink plate, the second heatsink plate being fixed to the semiconductor element in the plastic body, and the second surface being opposite to the first surface, wherein a bonded surface of the first heatsink plate with the plastic body comprises a high stress area, the high stress area has a possibility of generating tensile stress equal to or higher than a predetermined stress value, and a plurality of grooves, a plurality of protrusions, or both of the plurality of grooves and the plurality of protrusions are provided in the high stress area.
地址 Toyota-shi, Aichi-ken JP