发明名称 INDUCTIVELY COUPLED PLASMA MASS ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide an inductively coupled plasma mass analyzer capable of continuously measuring a high matrix sample with a good reproducibility. SOLUTION: The inductively coupled plasma mass analyzer includes a control unit 70 for combining the amount of liquid droplets in the aerosol supplied to a plasma torch 20, the flow rates of the carrier gases 76A and 76B in the aerosol, the RF output of a high frequency power supply 80 and the distance Z between the plasma torch 20 and sampling interfaces 15 and 16 to control them. The sensitivity of measured ions is altered to a desired degree to be set by the control by the control unit 70 and the ratio of the maximum and minimum values of the set ion detection degree is at least ten times in the sensitivity ratio of ions. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008045901(A) 申请公布日期 2008.02.28
申请号 JP20060219520 申请日期 2006.08.11
申请人 AGILENT TECHNOL INC 发明人 SAKATA KENICHI;YAMADA NORIYUKI
分类号 G01N27/62 主分类号 G01N27/62
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