发明名称 TRANSMISSION TYPE DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a transmission type defect inspection device and a method thereof capable of performing defect inspection by imaging an optical display panel with area cameras while moving it.SOLUTION: The transmission type defect inspection device comprises: a linear lighting device for emitting light toward an optical display panel; a plurality of area cameras 31 which are linearly and parallelly arranged so as to face the linear lighting device, which receive light that is emitted by the linear lighting device and transmits the optical display panel, and which image the optical display panel; an image processing part for processing images of the optical display panel captured by the area cameras 31; and a control part for controlling imaging timings of the area cameras 31 according to a moving speed of the optical display panel. The area cameras 31 image the optical display panel so that an image of the optical display panel captured for the nth (n≥1) time partly overlaps an image of the optical display panel captured for the (n+1)th time in a moving direction of the optical display panel.SELECTED DRAWING: Figure 1
申请公布号 JP2016121981(A) 申请公布日期 2016.07.07
申请号 JP20150060608 申请日期 2015.03.24
申请人 NITTO DENKO CORP 发明人 YURA TOMOKAZU;KOSHIO SATOSHI;KITADA KAZUO
分类号 G01N21/958;G01B11/30 主分类号 G01N21/958
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