QUANTITATIVE MEASURING METHOD AND APPARATUS OF METAL PHASE USING X-RAY DIFFRACTION METHOD, AND METHOD FOR MAKING PLATED STEEL SHEET USING THEM,申请号KR1020027006225-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	QUANTITATIVE MEASURING METHOD AND APPARATUS OF METAL PHASE USING X-RAY DIFFRACTION METHOD, AND METHOD FOR MAKING PLATED STEEL SHEET USING THEM
摘要
申请公布号	KR20020060741(A)	申请公布日期	2002.07.18
申请号	KR1020027006225	申请日期	2002.05.15
申请人		发明人
分类号	G01N23/207	主分类号	G01N23/207
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Carrier and developer material, and an image forming method

Supertwist liquid-crystal display

Wiping sheet and production thereof

Processes for the preparation of colorants

Modified atmosphere package with accelerated reduction of oxygen level in meat compartment

Simulator of logic circuit and simulation method

Method for treating rotary slag

Ear piercing template apparatus

Auditory and tactile feedback system for promoting development of individuals

Front pulley of a treadmill

Golf teeing apparatus

Apparatus for separating foreign matter from coins or similar disk-like objects

Interactive toy

Universal device for mounting circuit cards in a computer or like electrical machine

Train coupleable flotation tube for waterslides

Geared pump for conveying fluids

Scroll compressor with slider block

Cast ventilation sleeve

Ceiling fan and fan blade for a fan