| 摘要 |
PROBLEM TO BE SOLVED: To detect a defective pixel of the solid-state imaging device in a short period of time without the need for using a temperature sensor. SOLUTION: When a power button 21 is operated to apply power to a digital camera 2, a CPU 33 of the digital camera 2 drives a lens motor 31 to adjust a focus of an imaging lens 11 relative to a scale 12, compares the focal position with a focal position of the imaging lens 11 with respect to the scale 12 at a temperature stored in an EEPROM 49 and calculates the ambient temperature of the imaging lens 11 on the basis of the result of comparison. The CPU 33 detects a position of a defective pixel on the basis of the calculated ambient temperature and a relation between the ambient temperature stored in the EEPROM 49 and the position of the defective pixel of a CCD 36. An image signal processing circuit 45 interpolates image data of the pixel detected by the CPU 33 by using image data of pixels around the detected pixel or a preset predetermined value. COPYRIGHT: (C)2005,JPO&NCIPI
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