发明名称 Maskensatz zur Projektion von jeweils auf den Masken des Satzes angeordneten und aufeinander abgestimmten Strukturmustern auf einen Halbleiterwafer
摘要 Structure patterns mutually correlated on masks are projected onto the same photosensitive layer (R) on semiconductor wafer (W) in projection system. The first mask (P) contains opaque structure element (25) on first position so that its position projection onto wafer forms not-exposed region of lacquer in photo-sensitive layer. There is at least one second mask (T), allocated to first mask, with semi-transparent region (23') on second position of second mask, coinciding with first position on first mask, whose image on wafer illuminates at least part of lacquer region in photo-sensitive layer. Independent claims are included for method of producing set of several masks.
申请公布号 DE10310136(B4) 申请公布日期 2007.05.03
申请号 DE2003110136 申请日期 2003.03.07
申请人 INFINEON TECHNOLOGIES AG 发明人 DETTMANN, WOLFGANG;HENNIG, MARIO;PFORR, RAINER;KOEHLE, RODERICK;HOFSAES, MARKUS;THIELE, JOERG
分类号 G03F1/00;G03F7/20 主分类号 G03F1/00
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