发明名称 |
NON-VOLATILE MEMORY (NVM) CELL AND DEVICE STRUCTURE INTEGRATION |
摘要 |
A dielectric layer is formed over the substrate in the capacitor region and the memory region and a select gate layer is formed over the dielectric layer. A select gate is formed over the memory region and a plurality of lines of electrodes over the capacitor region from the select gate layer. A charge storage layer is formed over the capacitor region and the memory region including over the select gate and the plurality of lines. A control gate layer is formed over the charge storage layer over the capacitor region and over the memory region. The control gate layer is patterned to form a control gate of a memory cell over the memory region and a first electrode of a capacitor over the capacitor region. The plurality of lines are connected to the capacitor region to form a second electrode of the capacitor. |
申请公布号 |
US2016218112(A1) |
申请公布日期 |
2016.07.28 |
申请号 |
US201514604323 |
申请日期 |
2015.01.23 |
申请人 |
FREESCALE SEMICONDUCTOR, INC. |
发明人 |
SEKINE SATOSHI;HONG CHEONG MIN |
分类号 |
H01L27/115;H01L29/49;H01L21/28;H01L29/423;H01L49/02 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A method of making a semiconductor device using a substrate having a capacitor region and a memory region, comprising:
forming a dielectric layer over the substrate in the capacitor region and the memory region; forming a select gate layer over the dielectric layer in the capacitor region and the memory region; forming a select gate over the memory region and a plurality of lines of electrodes over the capacitor region from the select gate layer; forming a charge storage layer over the capacitor region and the memory region including over the select gate and the plurality of lines of electrodes; forming a control gate layer over the charge storage layer over the capacitor region and over the memory region; patterning the control gate layer to form a control gate of a memory cell over the memory region and a first electrode of a capacitor over the capacitor region; and connecting the plurality of lines of electrodes to the capacitor region to form a second electrode of the capacitor. |
地址 |
Austin TX US |