Memory device debugging on host platforms

摘要

A system and method are disclosed for an electronic integrated circuit to communicate with different hosts via different interfaces using the same host protocol. The system may use a host interface circuit to select a first set of electrical contacts or a second set of electrical contacts in order for a first host or a second host, respectively, to communicate with the electronic integrated circuit using a host protocol. The method may include switching from communicating with the first host using the first set of electrical contacts to communicating with the second host using the second set of electrical contacts in order for the second host to test the electronic integrated circuit.

主权项

1. An electronic integrated circuit configured to communicate with a first host and a second host, the electronic integrated circuit comprising:
electronic circuitry configured to perform at least one function and configured to communicate with the first host and the second host using a host protocol, wherein the electronic integrated circuit is configured for hardware installation inside the first host and wherein the second host is external to the first host; a package configured to house the electronic circuitry; a first set of electrical contacts on an exterior of the package and configured for communication with the first host via the host protocol; a second set of electrical contacts on the exterior of the package and configured for communication with the second host via the host protocol, wherein the second host uses one or more electrical contacts on an external interface of the first host and the second set of electrical contacts on the exterior of the package in order to communicate with the electronic circuitry; and a host interface switch configured to input one or more signals to select some or all of the first set of electrical contacts or to select some or all of the second set of electrical contacts in order for one of the first host or the second host to communicate with the electronic circuitry via the host protocol, wherein the one or more signals are indicative of a mode of the electronic integrated circuit, the mode being selected from at least a test mode and a non-test mode, wherein, in response to the one or more signals being indicative of the non-test mode, the host interface switch is configured to select the some or all of the first set of electrical contacts in order for the first host to communicate with at least a part of the electronic circuitry in the non-test mode, and wherein, in response to the one or more signals being indicative of the test mode, the host interface switch is configured to select the some or all of the second set of electrical contacts in order for the second host to test at least a part of the electronic circuitry.