发明名称 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD, AND ELECTRONIC COMPONENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive photosensitive resin composition capable of forming a cured film which is not brittle and good in heat resistance even by a low-temperature curing process. <P>SOLUTION: A first conductor layer 3, a second conductor layer 7 and an interlayer insulating film 4 are formed on a semiconductor substrate 1 on which a protective film 2 has been formed. The positive photosensitive resin composition is applied onto the interlayer insulating film 4 and the second conductor layer 7 by a spin coating method, dried, irradiated with light through a mask patterned to form windows 6c in predetermined parts, and developed with an aqueous alkali solution to form a pattern. Heating (curing) is then performed to form a surface protective film 8. This protective film 8 protects the conductor layers 3, 7 from external stress, &alpha;-rays, etc., and the resulting semiconductor device has excellent reliability. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011065167(A) 申请公布日期 2011.03.31
申请号 JP20100229657 申请日期 2010.10.12
申请人 HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD 发明人 MATSUTANI HIROSHI;HATTORI KOJI
分类号 G03F7/004;C07C39/16;C07C43/13;C07C43/23;C08G69/26;G03F7/023;G03F7/40;H01L21/027 主分类号 G03F7/004
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