发明名称 |
Wafer support plate for supporting a wafer during the process of producing a semi-conductor identifies a wafer's position on the support plate during heat treatment while detecting the wafer's correct position on the plate. |
摘要 |
A wafer support plate (10) for a TRACK system has a support plate body, six carrying supports (30) on the support plate body to hold a wafer and six laser emitter-detector measuring devices (231-236), each of which fits alongside a carrying support and inside the area encompassed by the carrying supports on the support plate.
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申请公布号 |
DE10033817(A1) |
申请公布日期 |
2001.11.08 |
申请号 |
DE20001033817 |
申请日期 |
2000.07.12 |
申请人 |
PROMOS TECHNOLOGIES, INC.;MOSEL VITELIC INC., HSIN CHU;INFINEON TECHNOLOGIES INC. |
发明人 |
CHEN, BRAD |
分类号 |
H01L21/683;G01B11/03;H01L21/00;H01L21/68;H01L21/687;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/683 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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