发明名称 Inspecting apparatus, image pickup apparatus, and inspecting method
摘要 An inspecting apparatus includes an illuminating optical system which irradiates irradiation light onto an object to be inspected, an object placing stage which moves the object along a first direction, an accumulative sensor which converts a transmitted image of the object into an electric signal, a sensor drive unit which moves the accumulative sensor in the irradiation direction and a second direction crossing the first direction, a moving amount detecting unit which detects a moving amount of the object placing stage in the second direction, a control unit which controls a drive amount of the sensor drive unit in the second direction on the basis of the moving amount in the second direction detected by the moving amount detecting unit, and a data comparing unit which compares the transmitted image data of the object with a reference data to detect a defect of the object.
申请公布号 US2006221332(A1) 申请公布日期 2006.10.05
申请号 US20060392656 申请日期 2006.03.30
申请人 FUJIWARA TAKESHI 发明人 FUJIWARA TAKESHI
分类号 G01N21/88;G01N21/956 主分类号 G01N21/88
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