| 摘要 |
<p>The present invention is related to an Atomic Force Microscopy probe, comprising a tip configuration (3) with two probe tips (7,8) on one cantilever arm (2), said probe tips being electrically isolated from each other and having essentially the same height with respect to the cantilever arm,
characterized in that the outer surface of the tip configuration (3) has the shape of a body with a base plane and an apex, the body being divided into two sub-parts (5,6) by a gap (4) located essentially symmetrically with respect to the apex and which gap is essentially perpendicular to the base plane. The invention is equally related to methods for producing such an AFM probe.</p> |
