发明名称 PROBE ARRAY, MANUFACTURING METHOD OF PROBE ARRAY, AND SAMPLE DETECTION METHOD USING PROBE ARRAY
摘要 PROBLEM TO BE SOLVED: To provide a probe array whose SNR is improved, a manufacturing method of the probe array whose SNR is improved, and a sample detection method using the probe array whose SNR is improved. SOLUTION: The probe array comprises a substrate including at least two or more mutually adjacent projecting features each of which includes a top surface and side surface, a separating region for separating the projecting features, at least two or more activating regions each of which includes the top surface of the projecting feature, and a deactivating region for separating the activate region and including the separating region as the deactivating region. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008046125(A) 申请公布日期 2008.02.28
申请号 JP20070211451 申请日期 2007.08.14
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM WON-SUN;CHI SUNG-MIN;HAH JUNG-HWAN;KIM KYUNG-SUN;CHOI SANG-JUN;RYOO MAN-HYOUNG
分类号 G01N33/53;G01N37/00 主分类号 G01N33/53
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