发明名称 METHOD OF PLASMA TREATMENT
摘要 PROBLEM TO BE SOLVED: To provide a plasma treatment apparatus and plasma treatment method for giving a uniform processing characteristics on a substrate plane, by offsetting the effect of the reaction products on the treatment characteristics in the plasma treatment of etching treatment, or the like. SOLUTION: In the method of plasma treatment for treating the substrate to be treated using a gas plasma via a mask in a treatment chamber, the amount of adhesion of a side protective film is adequately adjusted, and the adequately adjusted amount of adhesion is set equal in between the center and the circumference of the substrate, and plasma to be processed, while keeping uniformity within the plane of the side protective film. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008166839(A) 申请公布日期 2008.07.17
申请号 JP20080059622 申请日期 2008.03.10
申请人 HITACHI LTD 发明人 TAKAHASHI NUSHITO;KANAI SABURO;SATO HITOAKI;ISHIZU HISAZUMI
分类号 H01L21/306;H01L21/3065;B44C1/22;C03C15/00;C23F1/00;C23F4/00;H01L21/3213 主分类号 H01L21/306
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