发明名称 |
DEVICES FOR DETECTING CONTAMINATION IN COATINGS |
摘要 |
A device disclosed herein includes an optical detector that detects a specular reflection from a test article having a coating thereon. The device also includes a processor operatively coupled to the optical detector and configured to determine whether a contaminant is present at the coating based on the specular reflection and based on a calibration measurement determined from a test article having a known contaminant-free sample of the coating thereon. Another device disclosed herein includes an optical detector that detects a specular reflection from the test article having a coating thereon, with the specular reflection at an angle of less than 20° with respect to an axis normal to the test article. The device can further include a processor configured to determine whether contamination is present at the coating. Embodiments enable rapid, sensitive testing of epoxy and paint surfaces by minimally trained personnel. |
申请公布号 |
US2016178528(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201414578048 |
申请日期 |
2014.12.19 |
申请人 |
Agiltron, Inc. |
发明人 |
Weimer Wayne A.;Jin Guanghai |
分类号 |
G01N21/84;G01N21/94;G01N21/55 |
主分类号 |
G01N21/84 |
代理机构 |
|
代理人 |
|
主权项 |
1. A device comprising:
an optical detector configured to detect a specular reflection from a test article having a coating thereon; and a processor operatively coupled to the optical detector and configured to determine whether a contaminant is present at the coating based on the specular reflection and a calibration measurement determined from a calibration article having a known contaminant-free sample of the coating thereon. |
地址 |
Woburn MA US |