发明名称 Analytical test meter
摘要 A portable analytical test meter is designed for use with an associated analytical test strip. A test-strip-receiving module receives the analytical test strip and is electrically connected to a dummy load calibration circuit block. That block is configured to provide a dummy magnitude correction and a dummy phase correction; and a memory block is configured to store the dummy magnitude correction and the dummy phase correction. A method for calibrating a portable analytical test meter for use with an analytical test strip includes determining a dummy magnitude correction and a dummy phase correction of the portable analytical test meter using a dummy load calibration circuit block of the portable analytical test meter. The dummy magnitude correction and the dummy phase correction are stored in a memory block of the portable analytical test meter. Using the stored dummy magnitude correction and stored dummy phase correction, an analyte is determined.
申请公布号 US9395319(B2) 申请公布日期 2016.07.19
申请号 US201313875487 申请日期 2013.05.02
申请人 LifeScan Scotland Limited 发明人 Guthrie Brian;Lloyd Tim;Gadde Yeswanth;Strachan Alexander;Elder David;Massari Rossano;Forlani Christian
分类号 G01N27/30;G01N27/327 主分类号 G01N27/30
代理机构 代理人
主权项 1. A portable analytical test meter for use with an associated analytical test strip, the portable analytical test meter comprising: a) a test-strip-receiving module adapted to receive the analytical test strip; b) a dummy load calibration circuit block electrically connected to the test-strip-receiving module; and c) a memory block; d) wherein the dummy load circuit block is configured to provide a dummy magnitude correction and a dummy phase correction; and e) wherein the memory block is configured to store the dummy magnitude correction and the dummy phase correction, wherein the analytical test strip includes an analyte chamber and wherein: a1) the test-strip-receiving module includes first and second electrical connector pins; b1) the dummy load calibration circuit block includes: i) a dummy load having selected electrical characteristics;ii) an excitation source adapted to selectively provide at least one electrical signal;iii) a demodulator adapted to produce one or more demodulated signal(s);iv) a processor connected to receive the one or more demodulated signal(s) from the demodulator; andv) a switching unit adapted to selectively electrically connect the excitation source to the demodulator through either the dummy load or the first and second electrical pins of the test-strip-receiving module; and c1) the processor is programmed to: concurrently cause the switching unit to connect through the dummy load, cause the excitation source to provide a DC signal, and record first respective value(s) of the demodulated signal(s); determine a bias of the demodulator using the first respective value(s) and store the determined bias in the memory block; concurrently cause the switching unit to connect through the dummy load, cause the excitation source to simultaneously provide both an AC signal and the DC signal, and record second respective value(s) of the demodulated signal(s); determine the dummy magnitude correction and the dummy phase correction using the respective second value(s) and the determined bias of the demodulator, and store the determined dummy magnitude correction and dummy phase correction in the memory block; detect the insertion of a test strip in the test-strip-receiving module; concurrently cause the switching unit to connect through the first and second electrical pins, cause the excitation source to simultaneously provide both an AC signal and a DC signal, and after the insertion, record third respective value(s) of the demodulated signal(s); and determine phase and gain modifiers of the portable analytical test meter with test strip using the third respective value(s), the determined dummy magnitude correction and the determined dummy phase correction, and the determined bias of the demodulator, and store the determined phase and gain modifiers of the portable analytical test meter with test strip in the memory block.
地址 Inverness GB