发明名称 SLIT LAMP MICROSCOPE AND CONTROL METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a slit lamp microscope capable of achieving improvement on operability of the slit lamp microscope.SOLUTION: A slit lamp microscope includes the following elements: an illumination system 8 for illuminating an eye to be examined with slit light; an observation system 6 for guiding return light of the slit light from the eye to be examined to an ocular lens and/or an imaging device; an illumination moving mechanism 8A for moving the illumination system; an observation moving mechanism 6A for moving the observation system; a storage part 120 for storing, in advance, operation mode information associated with an operation content of at least one of the illumination system 8, the observation system 6, the illumination moving mechanism 8A, and the observation moving mechanism 6A for each of one or more operation modes; a designation part for designating the operation mode; and a control part 110 for specifying the operation content associated with the designated operation mode with reference to the operation mode information, and controlling at least one of the illumination system 8, the observation system 6, the illumination moving mechanism 8A, and the observation moving mechanism 6A based on the specified operation content.SELECTED DRAWING: Figure 3
申请公布号 JP2016179004(A) 申请公布日期 2016.10.13
申请号 JP20150060272 申请日期 2015.03.24
申请人 TOPCON CORP 发明人 TSUKADA HIROSHI
分类号 A61B3/135 主分类号 A61B3/135
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