发明名称 MEMORY DEVICE BIT LINE SENSING SYSTEM AND METHOD THAT COMPENSATES FOR BIT LINE RESISTANCE VARIATIONS
摘要 Systems, devices and methods are disclosed, such as a system and method of sensing the voltage on bit lines that, when respective memory cells coupled to the bit lines are being read that compensates for variations in the lengths of the bit lines between the memory cells being read and respective bit line sensing circuits. The system and method may determine the length of the bit lines between the memory cells and the sensing circuits based on a memory address, such as a block address. The system and method then uses the determined length to adjust either a precharge voltage applied to the bit lines or the duration during which the bit lines are discharged by respective memory cells before respective voltages on the bit lines are latched.
申请公布号 US2010020621(A1) 申请公布日期 2010.01.28
申请号 US20090569754 申请日期 2009.09.29
申请人 MICRON TECHNOLOGY, INC. 发明人 DOYLE DANIEL;QUINN JEFFREY B.
分类号 G11C7/10 主分类号 G11C7/10
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