发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a reliable semiconductor device including an oxide semiconductor and having the stable electric characteristics.SOLUTION: A manufacturing method for a semiconductor device includes: forming a gate electrode; forming a first insulating film on the gate electrode; supplying halogen atoms to the first insulating film by performing a halogen doping process on the first insulating film; forming an oxide semiconductor film overlapping with the gate electrode on the first insulating film; heating the oxide semiconductor film to remove hydrogen atoms from the oxide semiconductor film; supplying oxygen atoms to the oxide semiconductor film by performing an oxygen doping process to the oxide semiconductor film from which the hydrogen atoms have been removed; heating the oxide semiconductor film to which the oxygen atoms have been supplied; forming a source electrode and a drain electrode on and in contact with the oxide semiconductor film; and forming a second insulating film.SELECTED DRAWING: Figure 2 |
申请公布号 |
JP2016157959(A) |
申请公布日期 |
2016.09.01 |
申请号 |
JP20160065102 |
申请日期 |
2016.03.29 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI |
分类号 |
H01L29/786;H01L21/265;H01L21/336;H01L21/425;H01L21/477;H01L21/8234;H01L21/8242;H01L27/08;H01L27/088;H01L27/108;H01L27/146;H01L51/50;H05B33/10;H05B33/14 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|