发明名称 Vertically movable gate field effect transistor (VMGFET) on a silicon-on-insulator (SOI) wafer and method of forming a VMGFET
摘要 Methods for forming a vertically movable gate field effect transistor (VMGFET) on a silicon-on-insulator (SOI) wafer are described. The methods include providing a process of making VMGFET devices without critical alignment of masks between sequential etch and diffusion steps. The oxide layer of the SOI wafer is used for a self-limiting etch stop layer and for a sacrificial layer to form an insulating layer between a gate electrode and a substrate. The proper location of the gate electrode with respect to the source and drain junctions is insured by using a silicon gate structure as a mask layer for the diffusion process for defining the source and drain junctions.
申请公布号 US9450066(B2) 申请公布日期 2016.09.20
申请号 US201314435303 申请日期 2013.10.10
申请人 Texas State University 发明人 Song In-Hyouk;You Byoung Hee;Kang Heung Seok;Lee Kang-Hee
分类号 H01L29/51;H01L29/423;H01L29/78;H01L29/66;H01L21/00 主分类号 H01L29/51
代理机构 Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C. 代理人 Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C. ;Meyertons Eric B.
主权项 1. A method of making a semiconductor device, comprising: forming a sacrificial layer on a semiconductor substrate; forming a gate electrode on the sacrificial layer, wherein the gate electrode is composed of a single crystalline semiconductor material; removing a portion of the sacrificial layer over regions adjacent to the gate electrode that will become a source region and a drain region: implanting/diffusing ions into the source region and the drain region adjacent to the gate electrode while implanting/diffusing ions into the gate electrode, wherein the ions implanted into the gate electrode are the opposite conductivity type to the conductivity type of the semiconductor substrate; and then removing the remainder of the sacrificial layer, wherein removal of the sacrificial layer creates an air layer between the gate electrode and the semiconductor substrate, wherein the gate electrode is vertically movable within the air layer.
地址 San Marcos TX US