发明名称 A LITHOGRAPHIC PROCESS USING A NANOWIRE MASK, AND NANOSCALE DEVICES FABRICATED USING THE PROCESS
摘要 <p>The disclosure pertains to a method for making a nanoscale filed effect transistor structure on a semiconductor substrate. The method comprises disposing a mask on a semiconductor upper layer of a multi-layer substrate, and removing areas of the upper layer not covered by the mask in a nanowire lithography process. The mask includes two conductive terminals separated by a distance, and a nanowire in contact with the conductive terminals across the distance. The nanowire lithography may be carried out using a deep-reactive-ion-etching, which results in an integration of the nanowire mask and the underlying semiconductor layer to form a nanoscale semiconductor channel for the field effect transistor.</p>
申请公布号 KR20110050467(A) 申请公布日期 2011.05.13
申请号 KR20117004295 申请日期 2009.06.18
申请人 NOKIA CORPORATION 发明人 COLLI ALAN
分类号 H01L21/027;H01L21/336;H01L29/78 主分类号 H01L21/027
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