TEST BOARD FOR SEMICONDCUTOR MEMORY DEVICE AND TEST METHOD,申请号KR19970066772-传众专利搜索

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发明名称	TEST BOARD FOR SEMICONDCUTOR MEMORY DEVICE AND TEST METHOD
摘要
申请公布号	KR100498414(B1)	申请公布日期	2005.06.22
申请号	KR19970066772	申请日期	1997.12.08
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	SHIN, TAE JIN;KOO, GYO SEOL
分类号	G11C29/00;(IPC1-7):G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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