发明名称 Switch arrangement e.g. relay contact, examining method, involves utilizing test signal as indicator for switched path when comparison of test signal with stored signal sample, which results in compatible signal with signal sample
摘要 <p>The method involves conducting a test signal (PH1-PHn) over one of switched paths on an output side in a trouble-free condition, and assigning the test signal to an evaluation device (A). A permissible signal sample is stored in the evaluation device, and the test signal assigned to the evaluation device is compared with the stored signal sample. The test signal is utilized as an indicator for the switched path when the comparison results in a compatible signal with the stored signal sample. An alternating voltage signal is fed as a reference signal (PHR) to the evaluation device. An independent claim is also included for a device for examining a switch arrangement.</p>
申请公布号 DE102006047469(A1) 申请公布日期 2008.04.17
申请号 DE20061047469 申请日期 2006.10.04
申请人 BAUDIS, ARNE 发明人 BAUDIS, ARNE
分类号 G01R31/327 主分类号 G01R31/327
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