发明名称 Semiconductor constructions of memory devices with different sizes of GateLine trenches
摘要 Some embodiments include methods of recessing multiple materials to a common depth utilizing etchant comprising C4F6 and C4F3. The recessed materials may be within isolation regions, and the recessing may be utilized to form trenches for receiving gatelines. Some embodiments include structures having an island of semiconductor material laterally surrounded by electrically insulative material. Two gatelines extend across the insulative material and across the island of semiconductor material. One of the gatelines is recessed deeper into the electrically insulative material than the other.
申请公布号 US7948030(B2) 申请公布日期 2011.05.24
申请号 US20100875828 申请日期 2010.09.03
申请人 MICRON TECHNOLOGY, INC. 发明人 LINDHOLM LARSON;WILSON AARON R.;HWANG DAVID K.
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
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