发明名称 APPARATUS FOR TESTING ARRAY
摘要 PURPOSE: An array testing apparatus is provided to efficiently detect a defect of a large sized substrate while making a testing module horizontally move along an X axial direction or a Y axial direction. CONSTITUTION: A stage(15) mounts a substrate(S). A frame(10) supports the stage. A supporter(20) is installed at an upper part of the frame while moving along the Y axial direction. A testing module(30) is installed at the supporter while moving along the X axial direction. The testing module includes a light source and a modulator. The modulator is made of a reflecting layer, installed in contact with the substrate, and a photoelectric material layer, converting light intensity according to a size of an electric field generated between itself and the substrate.
申请公布号 KR20110070062(A) 申请公布日期 2011.06.24
申请号 KR20090126735 申请日期 2009.12.18
申请人 TOP ENGINEERING CO., LTD. 发明人 PARK, JONG HYOUN
分类号 G01R1/02;G01R31/01 主分类号 G01R1/02
代理机构 代理人
主权项
地址