发明名称 Electrical components for microelectronic devices
摘要 Electrical components for microelectronic devices and methods for forming electrical components. One particular embodiment of such a method comprises depositing an underlying layer onto a workpiece, and forming a conductive layer on the underlying layer. The method can continue by disposing a dielectric layer on the conductive layer. The underlying layer is a material that causes the dielectric layer to have a higher dielectric constant than without the underlying layer being present under the conductive layer. For example, the underlying layer can impart a structure or another property to the film stack that causes an otherwise amorphous dielectric layer to crystallize without having to undergo a separate high temperature annealing process after disposing the dielectric layer onto the conductive layer. Several examples of this method are expected to be very useful for forming dielectric layers with high dielectric constants because they avoid using a separate high temperature annealing process.
申请公布号 US7968969(B2) 申请公布日期 2011.06.28
申请号 US20090502630 申请日期 2009.07.14
申请人 MICRON TECHNOLOGY, INC. 发明人 KRISHNAN RISHIKESH;GEALY DAN;SRIVIDYA VIDYA;ROCKLEIN NOEL
分类号 H01L21/02 主分类号 H01L21/02
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