发明名称 半導体装置
摘要 The semiconductor device includes transistors which are stacked. The transistors include a semiconductor substrate having a groove portion and a pair of low-resistance regions between which the groove portion is provided, a first gate insulating film over the semiconductor substrate, a gate electrode overlapping with the groove portion with the first gate insulating film interposed therebetween, a second gate insulating film covering the gate electrode, a pair of electrodes provided over the second gate insulating film so that the groove portion is sandwiched between the pair of electrodes, and a semiconductor film in contact with the pair of electrodes. One of the pair of low-resistance region is electrically connected to one of the pair of electrodes. One of the transistors includes an n-type semiconductor and the other includes a p-type semiconductor, so that a complementary MOS circuit is formed.
申请公布号 JP5969256(B2) 申请公布日期 2016.08.17
申请号 JP20120097559 申请日期 2012.04.23
申请人 株式会社半導体エネルギー研究所 发明人 野田 耕生
分类号 H01L21/8234;H01L21/28;H01L21/8238;H01L27/088;H01L27/092;H01L29/41;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L21/8234
代理机构 代理人
主权项
地址