发明名称 |
Photoresist composition, compound and process of producing photoresist pattern |
摘要 |
A photoresist composition comprising
a resin having an acid-labile group,an acid generator, anda compound represented by formula (I0).; |
申请公布号 |
US9448475(B2) |
申请公布日期 |
2016.09.20 |
申请号 |
US201514625404 |
申请日期 |
2015.02.18 |
申请人 |
SUMITOMO CHEMICAL COMPANY, LIMITED |
发明人 |
Masuyama Tatsuro;Yasue Takahiro;Ichikawa Koji |
分类号 |
C07D347/00;C07D407/12;G03F7/038;G03F7/38;G03F7/027;C07D307/83 |
主分类号 |
C07D347/00 |
代理机构 |
Birch, Stewart, Kolasch & Birch, LLP |
代理人 |
Birch, Stewart, Kolasch & Birch, LLP |
主权项 |
1. A photoresist composition comprising
a resin having an acid-labile group, an acid generator, and a compound represented by formula (I0): wherein R01 represents a R3—CO—O— where R3 represents a C1-C22 hydrocarbon group in which a methylene group has been replaced by an oxygen atom or a carbonyl group or in which a hydrogen atom has been replaced by a hydroxy group, a nitro group or a halogen atom; R02 each independently represents a C1-C12 hydrocarbon group, a C1-C6 alkoxy group, a C2-C7 acyl group, a C2-C7 acyloxy group, a C2-C7 alkoxycarbonyl group, a nitro group, a hydroxy group or a halogen atom; and m represents an integer of 0 to 4. |
地址 |
Tokyo JP |