发明名称 Photoresist composition, compound and process of producing photoresist pattern
摘要 A photoresist composition comprising a resin having an acid-labile group,an acid generator, anda compound represented by formula (I0).;
申请公布号 US9448475(B2) 申请公布日期 2016.09.20
申请号 US201514625404 申请日期 2015.02.18
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED 发明人 Masuyama Tatsuro;Yasue Takahiro;Ichikawa Koji
分类号 C07D347/00;C07D407/12;G03F7/038;G03F7/38;G03F7/027;C07D307/83 主分类号 C07D347/00
代理机构 Birch, Stewart, Kolasch & Birch, LLP 代理人 Birch, Stewart, Kolasch & Birch, LLP
主权项 1. A photoresist composition comprising a resin having an acid-labile group, an acid generator, and a compound represented by formula (I0): wherein R01 represents a R3—CO—O— where R3 represents a C1-C22 hydrocarbon group in which a methylene group has been replaced by an oxygen atom or a carbonyl group or in which a hydrogen atom has been replaced by a hydroxy group, a nitro group or a halogen atom; R02 each independently represents a C1-C12 hydrocarbon group, a C1-C6 alkoxy group, a C2-C7 acyl group, a C2-C7 acyloxy group, a C2-C7 alkoxycarbonyl group, a nitro group, a hydroxy group or a halogen atom; and m represents an integer of 0 to 4.
地址 Tokyo JP