发明名称 |
SEMICONDUCTOR PACKAGES INCLUDING INTERCONNECTION MEMBERS |
摘要 |
A semiconductor package may include a main substrate, a sub-substrate spaced apart from the main substrate by a gap, and a semiconductor chip disposed on the main substrate. The semiconductor package may include an interconnection member configured to connect the semiconductor chip to the sub-substrate and including twisted wires of a plurality of strands. The semiconductor package may include a main molding member covering the main substrate and the semiconductor chip, and a sub-molding member covering the sub-substrate. The semiconductor package may include a stress buffer layer configured to fill the gap between the main substrate and the sub-substrate, and surround the interconnection member. |
申请公布号 |
US2016307867(A1) |
申请公布日期 |
2016.10.20 |
申请号 |
US201514831324 |
申请日期 |
2015.08.20 |
申请人 |
SK hynix Inc. |
发明人 |
JEONG Jung Tae |
分类号 |
H01L23/00;H01L23/498;H01L23/10 |
主分类号 |
H01L23/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor package comprising:
a main substrate; a sub-substrate spaced apart from the main substrate by a gap; a semiconductor chip disposed on the main substrate; an interconnection member including twisted wires of a plurality of strands and connecting the semiconductor chip to the sub-substrate; a main molding member covering the semiconductor chip and the main substrate; a sub-molding member covering the sub-substrate; and a stress buffer layer disposed between the main molding member and the sub-molding member, filling the gap between the main substrate and the sub-substrate, and surrounding a portion of the interconnection member, wherein a top surface of the stress buffer layer, a top surface of the main molding member and a top surface of the sub-molding member being coplanar. |
地址 |
Icheon-si Gyeonggi-do KR |