发明名称 PLASMA NITRIDING METHOD, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND PLASMA PROCESSING APPARATUS
摘要 A nitriding process is performed at a process temperature of 500° C. or more by causing microwave-excited high-density plasma of a nitrogen-containing gas to act on silicon in the surface of a target object, inside a process container of a plasma processing apparatus. The plasma is generated by supplying microwaves into the process container from a planar antenna having a plurality of slots.
申请公布号 US2009104787(A1) 申请公布日期 2009.04.23
申请号 US20060917013 申请日期 2006.06.07
申请人 TOHOKU UNIVERSITY;TOKYO ELECTRON LIMITED 发明人 OHMI TADAHIRO;TERAMOTO AKINOBU;HONDA MINORU;NAKANISHI TOSHIO
分类号 H01L21/31;C23C16/34;G05B19/00 主分类号 H01L21/31
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