发明名称 IMPROVED RAMAN SPECTROSCOPY SYSTEM
摘要 A system for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation is provided. The system comprises a tunable lens assembly having a tunable lens provided in the beam path between an electromagnetic radiation source and the object and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object. Based on detected electromagnetic radiation a control unit is capable making a decision to change the operational settings of the tunable lens.
申请公布号 WO2016193315(A2) 申请公布日期 2016.12.08
申请号 WO2016EP62398 申请日期 2016.06.01
申请人 SERSTECH AB 发明人 SZYBEK, Katja;SONNVIK, Jan
分类号 G01J3/02;G01J1/02;G01J3/44 主分类号 G01J3/02
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