| 摘要 |
PROBLEM TO BE SOLVED: To provide a laser ablation apparatus capable of preventing the adhesion of particulates to the inner wall of a sample chamber or the like, and a sample analyzer. SOLUTION: The laser ablation apparatus 2 is equipped with the sample chamber 5 and the sample 4 arranged in the sample chamber 5 is irradiated with a laser beam to finely pulverize a part of the sample 4. A gas introducing part 5a for introducing a carrier gas for transferring the finely pulverized sample 4 is provided. Further, the laser ablation apparatus 2 is constituted so as to provide an ion producer 37 for producing ions for removing static electricity in the sample chamber 5 and the ion producer 37 has a probe 39 for positive ions, a probe 40 for negative ions and a power supply 43 for feeding power to the respective probes 39 and 40. When ions for removing static electricity are discharged into the sample chamber 5 from the probes 39 and 40, the charged sample 4 and the ions are neutralized electrically. COPYRIGHT: (C)2006,JPO&NCIPI
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