发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, AND RECORDING MEDIUM
摘要 A semiconductor device manufacturing method, including: mounting substrates on a mounting table within a processing chamber along a rotation direction of the table; starting to supply a first-element-containing gas to a first region in the chamber along the rotation direction, while rotating the table and exhausting the processing chamber; starting to supply a second-element-containing gas to a second region in the chamber; starting to generate, by a plasma generating unit in the second region, plasma of the second-element-containing gas in the second region to have a first activity; and forming a thin film containing first and second elements on the substrates by rotating the table to cause the substrates to sequentially pass through the first and second regions in turn so that a first-element-containing layer is formed in the first region and is modified in the second region by generating plasma having a second activity higher than the first activity.
申请公布号 US2016284532(A1) 申请公布日期 2016.09.29
申请号 US201414778170 申请日期 2014.03.19
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 UEDA Tatsushi;TANABE Junichi;YAMAMOTO Katsuhiko;TAIRA Yuki;OHASHI Naofumi;ITATANI Hideharu
分类号 H01L21/02;H01J37/32;C23C16/455;C23C16/52;C23C16/44;C23C16/509;C23C16/40;H01L21/687;C23C16/458 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, comprising: mounting a plurality of substrates on a substrate mounting table rotatably installed within a processing chamber to process the substrates, the substrates being mounted along a rotation direction of the substrate mounting table; starting to supply a first-element-containing gas to a first processing region defined within the processing chamber along the rotation direction of the substrate mounting table, while rotating the substrate mounting table and exhausting an interior of the processing chamber; starting to supply a second-element-containing gas to a second processing region defined within the processing chamber; performing a first processing to begin generating, by a plasma generating unit installed in the second processing region, plasma of the second-element-containing gas in the second processing region to have a first activity; and performing a second processing to form a thin film containing a first element and a second element on each of the substrates by rotating the substrate mounting table to cause the substrates to sequentially pass through the first processing region and the second processing region a predetermined number of times in turn so that a first-element-containing layer is formed in the first processing region, and the first-element-containing layer is modified in the second processing region by generating plasma having a second activity that is higher than the first activity.
地址 Tokyo JP