发明名称 |
Interconnect structures comprising flexible buffer layers |
摘要 |
A structure includes a substrate, a low-k dielectric layer over the substrate, and a conductive barrier layer extending into the low-k dielectric layer. The conductive barrier layer includes a sidewall portion. A metal line in the low-k dielectric layer adjoins the conductive barrier layer. An organic buffer layer is between the sidewall portion of the conductive barrier layer and the low-k dielectric layer. |
申请公布号 |
US9466525(B2) |
申请公布日期 |
2016.10.11 |
申请号 |
US201514685217 |
申请日期 |
2015.04.13 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Peng Chao-Hsien;Huang Hsin-Yen;Lee Hsiang-Huan;Shue Shau-Lin |
分类号 |
H01L21/44;H01L21/768;H01L23/532;H01L21/02;H01L21/311;H01L23/522 |
主分类号 |
H01L21/44 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A method comprising:
forming an opening in a low-k dielectric layer comprising a single layer continuously extending from a top of the opening to a portion at bottom of the opening, with the opening exposing an underlying conductive line; coating a polymer layer into the opening; patterning the polymer layer to expose a top surface of the underlying conductive line, wherein after the patterning, a horizontal portion of the polymer layer remains to contact a top surface of the low-k dielectric layer; forming a conductive barrier layer over the polymer layer, wherein the conductive barrier layer extends into the opening to contact the underlying conductive line; filling a conductive material into a remaining portion of the opening; and performing a planarization to remove excess portions of the conductive material, the conductive barrier layer, and the polymer layer, wherein the excess portions are outside of the opening. |
地址 |
Hsin-Chu TW |