发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device, in which the semiconductor device having high quality is obtained by crystal-growing group-III nitride of high quality on a sapphire substrate. <P>SOLUTION: An AlN layer on the sapphire substrate 2 which has been nitrided directly is irradiated with gas including nitrogen radicals or nitrogen ions from a radial source 5 for a predetermined time. Then the group-III nitride is crystal-grown by a PLD (pulse laser deposition) method of irradiating a target 3a comprising a constituent element of the group-III nitride to be grown with pulse laser light in a nitrogen atmosphere to obtain N-polar crystal having extremely high quality. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011181762(A) |
申请公布日期 |
2011.09.15 |
申请号 |
JP20100045651 |
申请日期 |
2010.03.02 |
申请人 |
TOHOKU UNIV;UNIV OF TOKYO;TOKUYAMA CORP;SUMITOMO METAL MINING CO LTD |
发明人 |
FUKUYAMA HIROYUKI;FUJIOKA HIROSHI;UENO KOHEI |
分类号 |
H01L21/203;C30B25/18;C30B29/38;H01L21/205;H01L21/338;H01L29/778;H01L29/812;H01L31/10;H01L33/32 |
主分类号 |
H01L21/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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