发明名称 METHOD FOR FORMING SILICON QUANTUM DOT AND METHOD FOR FABRICATING SEMICONDUCTOR MEMORY DEVICE USING THE SAME TO FORM SILICON QUANTUM DOT WITH SINGLE CRYSTALLINE CHARACTERISTIC AND UNIFORM CHARACTERISTIC
摘要 PURPOSE: A method for forming a silicon quantum dot is provided to form a silicon quantum dot with a single crystalline characteristic and a uniform characteristic by using a plurality of metal clusters with a uniform interval of a nano size as an etch mask. CONSTITUTION: The first insulation layer(22) is stacked on a semiconductor substrate(10). A polysilicon layer is stacked on the first insulation layer. A plurality of metal clusters with a uniform interval is formed on the polysilicon layer. The polysilicon layer is dry-etched by using the metal clusters as a mask.
申请公布号 KR20050018382(A) 申请公布日期 2005.02.23
申请号 KR20030055787 申请日期 2003.08.12
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 KOH, KWAN JU
分类号 H01L21/336;H01L21/28;H01L21/3205;H01L29/423;(IPC1-7):H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址