发明名称 |
METHOD FOR FORMING SILICON QUANTUM DOT AND METHOD FOR FABRICATING SEMICONDUCTOR MEMORY DEVICE USING THE SAME TO FORM SILICON QUANTUM DOT WITH SINGLE CRYSTALLINE CHARACTERISTIC AND UNIFORM CHARACTERISTIC |
摘要 |
PURPOSE: A method for forming a silicon quantum dot is provided to form a silicon quantum dot with a single crystalline characteristic and a uniform characteristic by using a plurality of metal clusters with a uniform interval of a nano size as an etch mask. CONSTITUTION: The first insulation layer(22) is stacked on a semiconductor substrate(10). A polysilicon layer is stacked on the first insulation layer. A plurality of metal clusters with a uniform interval is formed on the polysilicon layer. The polysilicon layer is dry-etched by using the metal clusters as a mask.
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申请公布号 |
KR20050018382(A) |
申请公布日期 |
2005.02.23 |
申请号 |
KR20030055787 |
申请日期 |
2003.08.12 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
KOH, KWAN JU |
分类号 |
H01L21/336;H01L21/28;H01L21/3205;H01L29/423;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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