发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 One of the objectives of the present invention is to provide an oxide semiconductor appropriate for being used for a semiconductor device or the semiconductor device which uses the oxide semiconductor. For the semiconductor device which uses an In-Ga-Zn-O-based oxide semiconductor layer for a channel forming area of a transistor, the In-Ga-Zn-O-based oxide semiconductor layer has a structure in which crystal grains expressed as InGaO_3(ZnO)_m (m = 1) are included in a non-crystalline structure expressed as InGaO_3(ZnO)_m (M > 0).
申请公布号 KR20160064059(A) 申请公布日期 2016.06.07
申请号 KR20160063303 申请日期 2016.05.24
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 AKIMOTO KENGO;SAKATA JUNICHIRO;HIROHASHI TAKUYA;TAKAHASHI MASAHIRO;KISHIDA HIDEYUKI;MIYANAGA AKIHARU
分类号 H01L29/786;H01L21/02;H01L21/324;H01L27/12;H01L29/04;H01L29/26;H01L29/66 主分类号 H01L29/786
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