发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
One of the objectives of the present invention is to provide an oxide semiconductor appropriate for being used for a semiconductor device or the semiconductor device which uses the oxide semiconductor. For the semiconductor device which uses an In-Ga-Zn-O-based oxide semiconductor layer for a channel forming area of a transistor, the In-Ga-Zn-O-based oxide semiconductor layer has a structure in which crystal grains expressed as InGaO_3(ZnO)_m (m = 1) are included in a non-crystalline structure expressed as InGaO_3(ZnO)_m (M > 0). |
申请公布号 |
KR20160064059(A) |
申请公布日期 |
2016.06.07 |
申请号 |
KR20160063303 |
申请日期 |
2016.05.24 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
AKIMOTO KENGO;SAKATA JUNICHIRO;HIROHASHI TAKUYA;TAKAHASHI MASAHIRO;KISHIDA HIDEYUKI;MIYANAGA AKIHARU |
分类号 |
H01L29/786;H01L21/02;H01L21/324;H01L27/12;H01L29/04;H01L29/26;H01L29/66 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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