发明名称 半導体装置の製造方法、基板処理方法、基板処理装置、及びプログラム
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method, a substrate processing method, a substrate processing apparatus and a program, which can improve productivity under a low-temperature condition in comparison with a case without the present configuration.SOLUTION: A semiconductor device manufacturing method comprises: a process of forming thin films on a wafer 200 by performing predetermined times, a cycle including a process of supplying an IPCS gas to a wafer 200 in a processing chamber 201, and a process of supplying an NHgas to the wafer 200 in the processing chamber 201. In the process of supplying the NHgas, a supply flow rate of the NHgas changes in multi-step.
申请公布号 JP5945430(B2) 申请公布日期 2016.07.05
申请号 JP20120043315 申请日期 2012.02.29
申请人 株式会社日立国際電気 发明人 佐野 敦;▲ひろせ▼ 義朗
分类号 H01L21/314;H01L21/31;H01L21/316 主分类号 H01L21/314
代理机构 代理人
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