| 摘要 |
A diagnostic field device for identifying a diagnostic condition in an industrial process includes an infrared sensor array having a plurality of infrared sensors arranged to sense infrared emissions from a location in the industrial process. Processing circuitry processes outputs from the plurality of infrared sensors of the sensor array and generates an infrared image. Diagnostic circuitry compares processed outputs from at least two subsections of the infrared image and provides a diagnostic output based upon the comparison. |
