METHOD FOR OPTICAL INSPECTION OF TRANSPARENT ELECTRODE FILM

摘要

The present invention provides a method to optically inspect a transparent electrode film which uses an image acquired using an optical inspection device to inspect a defect of a sensor electrode mounted on a transparent electrode film, and improves a speed and accuracy for inspection. The method to optically inspect a transparent electrode film comprises: a first step of acquiring an image of a transparent electrode film on which a grid-type sensor electrode is mounted; a second step of converting the acquired image into black and white in accordance with a prescribed shade reference to acquire a threshold image; a third step of image-processing the threshold image to acquire a reference point extraction image; a fourth step of acquiring a reference point of a black block corresponding to the inside of the sensor electrode from the reference point extraction image; a fifth step of applying the acquired reference point to the threshold image, and setting a prescribed area around the reference point as an inspection area; and a sixth step of comparing a number of black pixels in the inspection area, and a number of black pixels corresponding to a prescribed defect condition.