| 摘要 |
An amplifier or other device under test (DUT) may be automatically modeled. A first simulation model of a first device is provided. One or more processors may be used to measure characteristics of the DUT, the characteristics including two or more of equalization, gain, distortion, and compression. The measured characteristics of the DUT are compared with the characteristics of the first simulation model, and corrective data is calculated based on the comparison. The corrective data is used along with the first simulation model to create a corrected model. The corrected model may be used to filter input signals. Where the DUT is an amplifier, sounds produced by an instrument coupled to the one or more processors produce a sound resembling that of the instrument played through the DUT. |
| 主权项 |
1. A method comprising:
storing a first simulation model of a first device, the first simulation model including characteristics; measuring, with one or more processors, characteristics of a device under test (DUT), the characteristics of the DUT including two or more of equalization, gain, distortion, and compression; comparing, with the one or more processors, the measured characteristics of the DUT with the characteristics of the first simulation model; calculating, with the one or more processors, corrective data based on the comparison; and creating a corrected model based on the corrective data and the first simulation module. |
