SYSTEM AND METHOD OF EDGE-ILLUMINATION MICROSCOPY

摘要

According to one aspect, the invention concerns a method for microscopy of a thick sample arranged on a sample support, with edge-illumination of the sample. The method comprises, in particular, emitting at least one illumination beam (1), forming, from the illumination beam, an illumination surface, focusing the illumination surface in the sample by means of a microscope lens (120) and deflecting the illumination surface originating from the microscope lens, in order to form a transverse illumination surface, located in a plane substantially perpendicular to the optical axis of the microscope lens. The method further comprises forming, by means of said microscope lens (120), the image of an area of the sample illuminated by the transverse illumination surface on a detection surface (131) of a detection device (130), scanning the illumination beam, allowing the transverse illumination surface to move along the optical axis of the microscope lens, and superimposing the object imaging surface and the transverse illumination surface, by focusing means comprising means separate from the means for the relative axial movement of the microscope lens and the sample.

主权项

1. A microscopy system for a thick sample with edge-illumination of the sample, comprising:
a sample holder; a detection pathway comprising:
a microscope lens of given optical axis and exit pupil;a detection device comprising a detection surface optically conjugate with an object imaging surface in the object space of the microscope lens;means for relative axial displacement of the microscope lens and of the sample holder; a sample illumination pathway comprising:
at least one emission source of an illumination beam;means for forming, from the illumination beam, an illumination surface;said microscope lens;deflection means making it possible to deflect the illumination surface in the object space at the output of the microscope lens, to form a transverse illumination surface, situated in a plane substantially at right angles to the optical axis of the microscope lens;scanning means for an angular scanning of the illumination beam, allowing a displacement of the transverse illumination surface along the optical axis of the microscope lens; the microscopy system further comprising means for varying the focusing of the illumination beam, making it possible to laterally center the transverse illumination surface on the object imaging surface, wherein said optical means are separate from the relative axial displacement means and have a pupil located in a plane optically conjugated with a plane of the exit pupil of the microscope lens.