发明名称 特徴点照合装置、特徴点照合方法、および特徴点照合プログラム
摘要 A purpose of the present invention is to match feature points with high accuracy even when geometric transformation such as two-dimensional affine transformation, projective transformation and the like is applied to images. A feature point matching device 5 according to the present invention includes position feature generation means 51 for generating a position feature quantity for a feature point based on a position of the feature point included in an image, pixel value feature generation means 52 for generating a pixel value feature quantity for the feature point based on a pixel value of the feature point included in the image, and feature matching means 53 for matching a first feature point and a second feature point based on a degree of matching between a first position feature quantity generated by the position feature generation means 51 from a first image and a second position feature quantity generated by the position feature generation means 51 from a second image and a degree of matching between a first pixel value feature quantity generated by the pixel value feature generation means 52 from the first image and a second pixel value feature quantity generated by the pixel value feature generation means 52 from the second image.
申请公布号 JP5958460(B2) 申请公布日期 2016.08.02
申请号 JP20130500712 申请日期 2011.11.01
申请人 日本電気株式会社 发明人 秋山 達勇
分类号 G06T7/00 主分类号 G06T7/00
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