发明名称 System and Method For Characterizing Ions Using A Superconducting Transmission Line Detector
摘要 A system and method for characterizing incident ions are provided. The method includes positioning a transmission line detector to receive incident ions, the transmission line detector comprising a superconducting meandering wire defining a detection area for incident ions, and applying a bias current to the transmission line detector. The method also includes detecting a first signal produced in the transmission line detector due to an ion impacting the detection area, and detecting a second signal produced in the transmission line detector due to the ion impacting the detection area. The method further includes analyzing the first signal and the second signal to characterize the ion. In some aspects, the method further includes identifying a delay between the first signal and the second signal to determine, using the identified delay, a location of the ion on the detection area.
申请公布号 US2016260596(A1) 申请公布日期 2016.09.08
申请号 US201514640257 申请日期 2015.03.06
申请人 McDermott III Robert Francis;Suttle Joseph Robert 发明人 McDermott III Robert Francis;Suttle Joseph Robert
分类号 H01J49/02;H01J49/00;H01J49/40 主分类号 H01J49/02
代理机构 代理人
主权项 1. A system for characterizing incident ions, the system comprising: a transmission line detector comprising: a superconducting meandering wire extending between a first end and a second end defining a detection area for the transmission line detector;a dielectric layer proximal to the superconducting meandering wire;a ground plane separated from the superconducting meandering wire by the dielectric layer, a first bias tee coupled to the first end of the superconducting meandering wire; a second bias tee coupled to the second end of the superconducting meandering wire; and a control system configured to: i. direct a current source coupled to the first bias tee to apply a bias current to the transmission line detector;ii. detect, using the first bias tee, a first signal produced in the transmission line detector due to an ion impacting the detection area;iii. detect, using the second bias tee, a second signal produced in the transmission line detector due to the ion impacting the detection area;iv. analyze the first signal and the second signal to characterize the ion.
地址 Madison WI US