OPTICAL DISTANCE MEASURING DEVICE AND METHOD FOR OPTICAL DISTANCE MEASUREMENT

摘要

The present invention describes an optical distance measuring device having a pulsed radiation source that is implemented to transmit, in a temporally contiguous radiation pulse period, a radiation pulse having a pulse duration tp that is shorter than the radiation pulse period, and to transmit no radiation pulse in a temporally contiguous dark period. Further, the optical distance measuring device includes a detector for detecting different amounts of radiation in two overlapping detection periods during the radiation pulse period to capture reflections of the radiation pulse at an object surface and a background radiation and/or in two overlapping detection periods during the dark period to capture background radiation. The optical distance measuring device further includes an evaluator determining a signal depending on a distance of the optical distance measuring device to an object based on the detected amount of radiation. Further, the present invention provides a method for optical distance measurement and for multiple sampling.

主权项

1. An apparatus comprising:
a capacitive pixel sensor element subjected to a charge or discharge process in dependence on a measured quantity that can be detected at a pixel sensor element output; at least one buffer amplifier; first and second sample capacitances; first and second switches, via which the first or the second sample capacitance can be connected to the pixel sensor element output via the at least one buffer amplifier; a controller that is implemented to control the first and second switches such that the first switch is closed in a first time window and the second switch is closed in a second time window, wherein the first time window and the second time window temporally overlap such that, at the end of the first and second time windows, different voltage signals describing the charge or discharge process of the capacitive pixel sensor element are applied to the first and second sample capacitances.