发明名称 SUBSTRATE CLEANING METHOD FOR REMOVING OXIDE FILM
摘要 It was found out that when radicals generated by plasma are fed to a treatment chamber via a plurality of holes (111) formed on a partition plate which separates a plasma-forming chamber (108) from the treatment chamber, and the radicals are mixed with a treatment gas which is separately fed to the treatment chamber, the excitation energy of the radicals is suppressed and thereby the substrate surface treatment at high Si-selectivity becomes possible, which makes it possible to conduct the surface treatment of removing native oxide film and organic matter without deteriorating the flatness of the substrate surface. The radicals in the plasma are fed to the treatment chamber via radical-passing holes (111) of a plasma-confinement electrode plate (110) for plasma separation, the treatment gas is fed to the treatment chamber (121) to be mixed with the radicals in the treatment chamber, and then the substrate surface is cleaned by the mixed atmosphere of the radicals and the treatment gas.
申请公布号 US2016343565(A1) 申请公布日期 2016.11.24
申请号 US201615161892 申请日期 2016.05.23
申请人 CANON ANELVA CORPORATION 发明人 SEINO Takuya;IKEMOTO Manabu;MASHIMO Kimiko
分类号 H01L21/02;H01L21/67;H01L21/28 主分类号 H01L21/02
代理机构 代理人
主权项
地址 Kawasaki-shi JP